Simple method based on intensity measurements for characterization of aberrations from micro-optical components.
Fiche publication
Date publication
novembre 2015
Auteurs
Membres identifiés du Cancéropôle Est :
Dr FROEHLY Luc
Tous les auteurs :
Perrin S, Baranski M, Froehly L, Albero J, Passilly N, Gorecki C
Lien Pubmed
Résumé
We report a simple method, based on intensity measurements, for the characterization of the wavefront and aberrations produced by micro-optical focusing elements. This method employs the setup presented earlier in [Opt. Express22, 13202 (2014)OPEXFF1094-408710.1364/OE.22.013202] for measurements of the 3D point spread function, on which a basic phase-retrieval algorithm is applied. This combination allows for retrieval of the wavefront generated by the micro-optical element and, in addition, quantification of the optical aberrations through the wavefront decomposition with Zernike polynomials. The optical setup requires only an in-motion imaging system. The technique, adapted for the optimization of micro-optical component fabrication, is demonstrated by characterizing a planoconvex microlens.
Référence
Appl Opt. 2015 Nov 1;54(31):9060-4